High-mobility high-Ge-content Si1-xGex-OI PMOS FinFETs with fins formed using 3D germanium condensation with Ge fraction up to x∼ 0.7, scaled EOT∼8.5Å and ∼10nm fin width. - Pouya Hashemi; Takashi Ando; Karthik Balakrishnan; John Bruley; Sebastian U. Engelmann; John A. Ott; Vijay Narayanan; D.-G. Park; Renee T. Mo; Effendi Leobandung (VLSIC, 2015)

Interface engineering of Si1-xGex gate stacks for high performance dual channel CMOS. - ChoongHyun Lee; Richard G. Southwick; Shogo Mochizuki; Paul Jamison; Ruqiang Bao; Rajan Kumar Pandey; Aniruddha Konar; Takashi Ando; Vijay Narayanan; Bala Haran; Hemanth Jagannathan (ASICON, 2017)

Electron mobility in thin In0.53Ga0.47As channel. - Eduard Cartier; Atreya Majumdar; K.-T. Lee; Takashi Ando; Martin M. Frank; John Rozen; Keith A. Jenkins; C. Liang; C.-W. Cheng; John Bruley; M. Hopstaken; Pranita Kerber; et al. (ESSDERC, 2017)

PBTI in InGaAs MOS capacitors with Al2O3/HfO2/TiN gate stacks: Interface-state generation. - Eduard Cartier; Martin M. Frank; Takashi Ando; John Rozen; Vijay Narayanan (IRPS, 2018)

A Self-Powered Supply-Sensing Biosensor Platform Using Bio Fuel Cell and Low-Voltage, Low-Cost CMOS Supply-Controlled Ring Oscillator With Inductive-Coupling Transmitter for Healthcare IoT. - Kiichi Niitsu; Atsuki Kobayashi; Yuya Nishio; Kenya Hayashi; Kei Ikeda; Takashi Ando; Yudai Ogawa; Hiroyuki Kai; Matsuhiko Nishizawa; Kazuo Nakazato (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

Reliability Challenges with Materials for Analog Computing. - Eduard A. Cartier; Wanki Kim; Nanbo Gong; Tayfun Gokmen; Martin M. Frank; Douglas M. Bishop; Youngseok Kim; Seyoung Kim; Takashi Ando; Ernest Y. Wu; Praneet Adusumilli; John Rozen; et al. (IRPS, 2019)

Zero-shifting Technique for Deep Neural Network Training on Resistive Cross-point Arrays. - Hyungjun Kim; Malte J. Rasch; Tayfun Gokmen; Takashi Ando; Hiroyuki Miyazoe; Jae-Joon Kim; John Rozen; Seyoung Kim (CoRR, 2019)

A Time Alignment Method for Multiple Sensing Systems with GNSS Timing and IMUs with Frame-Sync Input. - Takashi Ando; Tomoya Kitani (PerCom Workshops, 2020)

Filament Localization and Characterization in Hf02 ReRAM Cells using Laser Stimulation. - Franco Stellari; Ernest Y. Wu; Martin M. Frank; Leonidas E. Ocala; Takashi Ando; Peilin Song (ESSDERC, 2022)

General Statistical Model for Dielectric Breakdown Including Reverse Area Scaling - The Role of Area-Dependent Dynamic Competition. - Ernest Y. Wu; Takashi Ando; Paul Jamison (IRPS, 2024)

Modulating Competition between Defect Generation and Annihilation in Dielectric Breakdown Showing a Full Range of Reverse, Diminishing, and Forward Area Scaling Trends. - Ernest Y. Wu; Paul Jamison; Steven Consiglio; Takaaki Tsunomura; Takashi Ando (IRPS, 2025)

Assessing the Performance of Analog Training for Transfer Learning. - Omobayode Fagbohungbe; Corey Lammie; Malte J. Rasch; Takashi Ando; Tayfun Gokmen; Vijay Narayanan (ISCAS, 2025)