Evaluation of Null Method for Operational Amplifier Short-Time Testing. - Riho Aoki; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Yuto Sasaki; Kosuke Machida; Takayuki Nakatani; Jianlong Wang; Anna Kuwana; Kazumi Hatayama; et al. (ASICON, 2019)

High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm. - Jiang-Lin Wei; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Nene Kushita; Takahiro Arai; Lei Sha; Anna Kuwana; Haruo Kobayashi 001; Takayuki Nakatani; Kazumi Hatayama; Keno Sato (ASICON, 2019)

Accurate and Fast Testing Technique of Operational Amplifier DC Offset Voltage in µV-Order by DC-AC Conversion. - Yuto Sasaki; Kosuke Machida; Riho Aoki; Shogo Katayama; Takayuki Nakatani; Jianlong Wang; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Kazumi Hatayama; et al. (ITC-Asia, 2019)

Innovative Test Practices in Japan. - Yusuke Asada; Takahiko Shimizu; Yuji Gendai; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Jiang-Lin Wei; Nene Kushita; Hirotaka Arai; Anna Kuwana; Takayuki Nakatani; et al. (VTS, 2019)

Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers. - Gaku Ogihara; Takayuki Nakatani; Akemi Hatta; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Riho Aoki; Shogo Katayama; Jianglin Wei; Yujie Zhao; et al. (ATS, 2020)

Accurate Testing of Precision Voltage Reference by DC-AC Conversion. - Keno Sato; Takayuki Nakatani; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Anna Kuwana; Kazumi Hatayama; Haruo Kobayashi 001 (ATS, 2020)

High Precision Measurement of Sub-Nano Ampere Current in ATE Environment. - Keno Sato; Takayuki Nakatani; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Gaku Ogihara; Daisuke Iimori; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kazumi Hatayama; et al. (ATS, 2021)

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production. - Gaku Ogihara; Takayuki Nakatani; Daisuke Iimori; Shogo Katayama; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Yujie Zhao; Jianglin Wei; Kazumi Hatayama; et al. (ICECS, 2021)

Metallic Ratio Equivalent-Time Sampling: A Highly Efficient Waveform Acquisition Method. - Shuhei Yamamoto; Yuto Sasaki; Yujie Zhao; Jianglin Wei; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Takayuki Nakatani; Minh Tri Tran 001; Shogo Katayama; et al. (IOLTS, 2021)

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer. - Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Akemi Hatta; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Jianglin Wei; Yujie Zhao; et al. (ITC, 2021)

Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies. - Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Jianglin Wei; Takayuki Nakatani; Yujie Zhao; Shogo Katayama; Shuhei Yamamoto; Anna Kuwana; Kazumi Hatayama; Haruo Kobayashi 001 (ITC, 2021)

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. - Keno Sato; Takayuki Nakatani; Shogo Katayama; Daisuke Iimori; Gaku Ogihara; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Yujie Zhao; Kentaroh Katoh; Anna Kuwana; Kazumi Hatayama; et al. (ATS, 2022)

Innovative Practices Track: Innovative Analog Circuit Testing Technologies. - Chris Mangelsdorf; Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán; Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kentaroh Katoh; et al. (VTS, 2022)

Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies. - Yujie Zhao; Kentaroh Katoh; Anna Kuwana; Shogo Katayama; Jianglin Wei; Haruo Kobayashi 001; Takayuki Nakatani; Kazumi Hatayama; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa (J. Electron. Test., 2022)

A Physically Unclonable Function Using Time-to-Digital Converter with Linearity Self-Calibration and its FPGA Implementation. - Kentaroh Katoh; Shuhei Yamamoto; Zheming Zhao; Yujie Zhao; Shogo Katayama; Anna Kuwana; Takayuki Nakatani; Kazumi Hatayama; Haruo Kobayashi 001; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; et al. (ITC-Asia, 2023)

Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. - Keno Sato; Takayuki Nakatani; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Daisuke Iimori; Misaki Takagi; Yujie Zhao; Shuhei Yamamoto; Anna Kuwana; Kentaroh Katoh; et al. (ITC, 2023)

Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing. - Shogo Katayama; Takayuki Nakatani; Daisuke Iimori; Misaki Takagi; Yujie Zhao; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Kentaroh Katoh; Kazumi Hatayama; et al. (IEICE Electron. Express, 2023)