BIST-Aided Scan Test - A New Method for Test Cost Reduction. - Takahisa Hiraide; Kwame Osei Boateng; Hideaki Konishi; Koichi Itaya; Michiaki Emori; Hitoshi Yamanaka; Takashi Mochiyama (VTS, 2003)

Detection of multiple transitions in delay fault test of SPARC64 microprocessor. - Daisuke Maruyama; Akira Kanuma; Takashi Mochiyama; Hiroaki Komatsu; Yaroku Sugiyama; Noriyuki Ito (ICCAD, 2004)