Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition. - Koichi Endo; Kenji Norimatsu; Tomonori Nakamura; Takashi Setoya; Koji Nakamae (Microelectron. Reliab., 2015)

Destruction failure analysis and international reliability test standard for power devices. - Takashi Setoya; Tsuneo Ogura; Wataru Saito; Tomoko Matsudai; Koichi Endo (Microelectron. Reliab., 2015)