Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance. - Kan Takeuchi; Masaki Shimada; Shinya Konishi; Daisuke Oshida; Naoya Ota; Takashi Yasumasu; Koji Shibutani; Tomohiro Iwashita; Tetsuya Kokubun; Fumio Tsuchiya (IRPS, 2019)