Maximum Clique Algorithm for Uniform Test Forms Assembly. - Takatoshi Ishii; Pokpong Songmuang; Maomi Ueno (AIED, 2013)

Maximum Clique Algorithm and ItsApproximation for UniformTest Form Assembly. - Takatoshi Ishii; Pokpong Songmuang; Maomi Ueno (IEEE Trans. Learn. Technol., 2014)

Clique Algorithm to Minimize Item Exposure for Uniform Test Forms Assembly. - Takatoshi Ishii; Maomi Ueno (AIED, 2015)

A Topic Model for Clustering Learners Based on Contents in Educational Counseling. - Takatoshi Ishii; Satoshi Mizoguchi; Koji Kimita; Yoshiki Shimomura (HCI (5), 2015)

Learning State Model for Value Co-Creative Education Services. - Koji Kimita; Keita Muto; Satoshi Mizoguchi; Yutaro Nemoto; Takatoshi Ishii; Yoshiki Shimomura (HCI (5), 2015)

A Method for Supporting Customer Model Construction: Using a Topic Model for Public Service Design. - Satoshi Mizoguchi; Takatoshi Ishii; Yutaro Nemoto; Maiko Kaneda; Atsuko Bando; Toshiyuki Nakamura; Yoshiki Shimomura (ICServ, 2015)

Development and evaluation of a self-learning support system for Patent Act suited to the current state of intellectual property education in engineering departments. - Takako Akakura; Takatoshi Ishii (TALE, 2016)

A framework to search better series of lecture improvement. - Takatoshi Ishii; Takako Akakura (TALE, 2016)

Face authentication for e-Learning using time series information. - Taisuke Kawamata; Takatoshi Ishii; Takako Akakura (TALE, 2016)

Item bank to estimate the answers of class evaluation questionnaire. - Shuya Nakamura; Takatoshi Ishii; Takako Akakura (TALE, 2016)

Algorithm for Uniform Test Assembly Using a Maximum Clique Problem and Integer Programming. - Takatoshi Ishii; Maomi Ueno (AIED, 2017)

A method for identifying customer orientations and requirements for product-service systems design. - Yoshiki Shimomura; Yutaro Nemoto; Takatoshi Ishii; Toshiyuki Nakamura (Int. J. Prod. Res., 2018)

Hybrid Maximum Clique Algorithm Using Parallel Integer Programming for Uniform Test Assembly. - Kazuma Fuchimoto; Takatoshi Ishii; Maomi Ueno (IEEE Trans. Learn. Technol., 2022)