Filament scaling forming technique and level-verify-write scheme with endurance over 107 cycles in ReRAM. - Akifumi Kawahara; Ken Kawai; Yuuichirou Ikeda; Yoshikazu Katoh; Ryotaro Azuma; Yuhei Yoshimoto; Kouhei Tanabe; Zhiqiang Wei 005; Takeki Ninomiya; Koji Katayama; Ryutaro Yasuhara; Shunsaku Muraoka; et al. (ISSCC, 2013)

Quantitative method for estimating characteristics of conductive filament in ReRAM. - Zhiqiang Wei 005; Ryutaro Yasuhara; Koji Katayama; Takumi Mikawa; Takeki Ninomiya; Shunsaku Muraoka (ISCAS, 2014)

Theoretical and Experimental Approaches to Select Resistive Switching Material. - Takeki Ninomiya; Zhiqiang Wei 005; Shinichi Yoneda; Kenji Shiraishi (IEICE Trans. Electron., 2015)