Mentor Graphics DFT to Navigate Nanometer Test Challenges. - Greg Aldrich; Ron Press; Takeo Kobayashi; Tatsuo Sakajiri (ATS, 2006)

At-Speed Testing with Timing Exceptions and Constraints-Case Studies. - Dhiraj Goswami; Kun-Han Tsai; Mark Kassab; Takeo Kobayashi; Janusz Rajski; Bruce Swanson; Darryl Walters; Yasuo Sato; Toshiharu Asaka; Takashi Aikyo (ATS, 2006)

Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects. - Xijiang Lin; Kun-Han Tsai; Chen Wang 014; Mark Kassab; Janusz Rajski; Takeo Kobayashi; Randy Klingenberg; Yasuo Sato; Shuji Hamada; Takashi Aikyo (ATS, 2006)

Enhancing Transition Fault Model for Delay Defect Diagnosis. - Wu-Tung Cheng; Brady Benware; Ruifeng Guo; Kun-Han Tsai; Takeo Kobayashi; Kazuyuki Maruo; Michinobu Nakao; Yoshiaki Fukui; Hideyuki Otake (ATS, 2008)

Test Quality Improvement with Timing-aware ATPG: Screening small delay defect case study. - Che-Jen Jerry Chang; Takeo Kobayashi (ITC, 2008)

On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation. - Xijiang Lin; Wu-Tung Cheng; Takeo Kobayashi; Andreas Glowatz (ATS, 2021)