Hybrid BIST Using Partially Rotational Scan. - Kenichi Ichino; Takeshi Asakawa; Satoshi Fukumoto; Kazuhiko Iwasaki; Seiji Kajihara (Asian Test Symposium, 2001)

Using ATPG vectors for BIST test pattern generator. - Takeshi Asakawa; Kazuhiko Iwasaki (Syst. Comput. Jpn., 2001)

BIST-oriented test pattern generator for detection of transition faults. - Takeshi Asakawa; Kazuhiko Iwasaki; Seiji Kajihara (Syst. Comput. Jpn., 2003)

Tester Structure Expression Language and Its Application to the Environment for VLSI Tester Program Development. - Masayuki Sato; Hiroki Wakamatsu; Masayuki Arai; Kenichi Ichino; Kazuhiko Iwasaki; Takeshi Asakawa (J. Inf. Process. Syst., 2008)