Surface Potential Measurement of a Silicon Fast Recovery Diode under Applied Bias Voltages by Kelvin Probe Force Microscopy. - Takeshi Uruma; Nobuo Satoh; Hidekazu Yamamoto; Futoshi Iwata (MHS, 2018)

Imaging of an Electret Film Fabricated on a Micro-Machined Energy Harvester by a Kelvin Probe Force Microscope. - Kenta Nakazawa; Kengo Fukazawa; Takeshi Uruma; Gen Hashiguchi; Futoshi Iwata (IEEE Trans. Instrum. Meas., 2022)