A Bayesian indicator for Run-to-Run performance assessment in semiconductor manufacturing. - Taki Eddine Korabi; Guillaume Graton; El Mostafa El Adel; Mustapha Ouladsine; Jacques Pinaton (PRIME, 2018)

A Bayesian indicator for Run-to-Run Performance Assessment using Industrail Risk. - Taki Eddine Korabi; Guillaume Graton; El Mostafa El Adel; Mustapha Ouladsine; Jacques Pinaton (WSC, 2018)

Monitoring of a sampled process data under Run-to-Run control: application to a semiconductor process. - Taki Eddine Korabi; Guillaume Graton; El Mostafa El Adel; Mustapha Ouladsine; Jacques Pinaton (CASE, 2019)