Design of High-Level Test Language for Digital LSI. - Takuji Okamoto; Hiroyuki Shibata; Kozo Kinoshita (ITC, 1983)

Decentralized priority encoder and its applications. - Toshiyuki Maeda; Yoichiro Sato; Tokumi Yokohira; Takuji Okamoto (Syst. Comput. Jpn., 1991)

Universal test complexity of field-programmable gate arrays. - Tomoo Inoue; Hideo Fujiwara; Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto (Asian Test Symposium, 1995)

The Number of Elements in Minimum Test Set for Locally Exhaustive Testing of Combinational Circuits with Five Outputs. - Tokumi Yokohira; Toshimi Shimizu; Hiroyuki Michinishi; Yuji Sugiyama; Takuji Okamoto (IEICE Trans. Inf. Syst., 1995)

A Test Methodology for Interconnect Structures of LUT-based FPGAs. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Tomoo Inoue; Hideo Fujiwara (Asian Test Symposium, 1996)

Realization of multiwindow system with high-speed operations of nonrectangular windows. - Toshiyuki Maeda; Yoichiro Sato; Tokumi Yokohira; Takuji Okamoto (Syst. Comput. Jpn., 1996)

Timing verification of asynchronous sequential circuits with specifications - A method of reducing state transitions to be verified in detail. - Atsushi Ohnishi; Yuji Sugiyama; Takuji Okamoto (Syst. Comput. Jpn., 1996)

A method of shortening metastable operation duration time by the use of feedback. - Yoichiro Sato; Takuji Okamoto; Yuji Sugiyama; Masahiro Kawai; Toshifumi Kobayashi (Syst. Comput. Jpn., 1996)

Testing for the programming circuit of LUT-based FPGAs. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Tomoo Inoue; Hideo Fujiwara (Asian Test Symposium, 1997)

A method of affine transformation for rectangular video image. - Hiroto Kagotani; Yoichiro Sato; Yoshimichi Takahara; Takuji Okamoto (Syst. Comput. Jpn., 2000)

Systematic reducing of metastable operations in CMOS D flip-flops. - Yoichiro Sato; Yoshinobu Yamasoto; Masanori Saito; Hiroto Kagotani; Takuji Okamoto; Masahiro Kawai (Syst. Comput. Jpn., 2000)

Synthesis of four-phase asynchronous control circuits from pipeline dependency graphs. - Hiroto Kagotani; Takuji Okamoto; Takashi Nanya (ASP-DAC, 2001)

A dynamic traffic sharing with minimal administration on multihomed networks. - Nariyoshi Yamai; Kiyohiko Okayama; Hiroshi Shimamoto; Takuji Okamoto (ICC, 2001)

CMOS Floating Gate Defect Detection Using I DDQ Test with DC Power Supply. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (Asian Test Symposium, 2002)

Improvement of Detectability for CMOS Floating Gate Defects in Supply Current Test. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (Asian Test Symposium, 2003)

CMOS Floating Gate Defect Detection Using Supply Current Test with DC Power Supply Superposed by AC Component. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (IEICE Trans. Inf. Syst., 2004)

Model analysis of coronary hemodynamics incorporating autoregulation. - Mitsuyasu Kagiyama; Hiroyuki Michinishi; Hiroto Kagotani; Takuji Okamoto; Yasuo Ogasawara; Fumihiko Kajiya (Syst. Comput. Jpn., 2004)

Superconductive logic circuits constructed by the use of two thresholds of SQUID. - Masahiro Kawai; Yoichiro Sato; Hiroto Kagotani; Takuji Okamoto (Syst. Comput. Jpn., 2005)

Detection of CMOS Open Node Defects by Frequency Analysis. - Hiroyuki Michinishi; Tokumi Yokohira; Takuji Okamoto; Toshifumi Kobayashi; Tsutomu Hondo (IEICE Trans. Inf. Syst., 2007)