RF ESD protection strategies - the design and performance trade-off challenges. - Philippe Jansen; Steven Thijs; Dimitri Linten; M. I. Natarajan; Vesselin K. Vassilev; Mingxu Liu; Ann Concannon; David Trémouilles; Takeshi Nakaie; Masanori Sawada; Vladislav A. Vashchenko; Marcel ter Beek; et al. (CICC, 2005)

ESD On-Wafer Characterization: Is TLP Still the Right Measurement Tool? - Mirko Scholz; Dimitri Linten; Steven Thijs; Sandeep Sangameswaran; Masanori Sawada; Toshiyuki Nakaei; Takumi Hasebe; Guido Groeseneken (IEEE Trans. Instrum. Meas., 2009)