Compact Modeling of NBTI Replicating AC Stress / Recovery from a Single-shot Long-term DC Measurement. - Takumi Hosaka; Shinichi Nishizawa; Ryo Kishida; Takashi Matsumoto; Kazutoshi Kobayashi (IOLTS, 2019)

Universal NBTI Compact Model Replicating AC Stress/Recovery from a Single-shot Long-term DC Measurement. - Takumi Hosaka; Shinichi Nishizawa; Ryo Kishida; Takashi Matsumoto; Kazutoshi Kobayashi (IPSJ Trans. Syst. LSI Des. Methodol., 2020)