A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm 4000 × 1 Transistor Arrays in 90nm CMOS. - David Levacq; Takuya Minakawa; Makoto Takamiya; Takayasu Sakurai (CICC, 2007)

1/5 power reduction by global optimization based on fine-grained body biasing. - Yasumi Nakamura; David Levacq; Limin Xiao; Takuya Minakawa; Taro Niiyama; Makoto Takamiya; Takayasu Sakurai (CICC, 2008)