Session Initiation Protocol (SIP) Usage of the Offer/Answer Model. - Shunsuke Okumura; Takuya Sawada; Paul H. Kyzivat (RFC, 2011)

Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation. - Takuya Sawada; Taku Toshikawa; Kumpei Yoshikawa; Hidehiro Takata; Koji Nii; Makoto Nagata (IEICE Trans. Electron., 2012)

A Step Size Control Method Improving Estimation Speed in Double Talk Term. - Takuto Yoshioka; Kana Yamasaki; Takuya Sawada; Kensaku Fujii; Mitsuji Muneyasu; Masakazu Morimoto (IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2013)

An insertion loss control method for supplementing cancellation effect deteriorated by echo path change in hands free telecommunication system. - Kensaku Fujii; Mitsuji Muneyasu; Takuya Sawada; Takuto Yoshioka; Masakazu Morimoto (APCCAS, 2014)

A 40-nm resilient cache memory for dynamic variation tolerance with bit-enhancing memory and on-chip diagnosis structures delivering ×91 failure rate improvement. - Yohei Nakata; Yuta Kimi; Shunsuke Okumura; Jinwook Jung; Takuya Sawada; Taku Toshikawa; Makoto Nagata; Hirofumi Nakano; Makoto Yabuuchi; Hidehiro Fujiwara; Koji Nii; Hiroyuki Kawai; et al. (ISQED, 2014)

A 40-nm Resilient Cache Memory for Dynamic Variation Tolerance Delivering ×91 Failure Rate Improvement under 35% Supply Voltage Fluctuation. - Yohei Nakata; Yuta Kimi; Shunsuke Okumura; Jinwook Jung; Takuya Sawada; Taku Toshikawa; Makoto Nagata; Hirofumi Nakano; Makoto Yabuuchi; Hidehiro Fujiwara; Koji Nii; Hiroyuki Kawai; et al. (IEICE Trans. Electron., 2014)

An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference. - Takuya Sawada; Kumpei Yoshikawa; Hidehiro Takata; Koji Nii; Makoto Nagata (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Character input system based on EMG signals generated by eye blinks. - Yoshiko Maruyama; Takuya Sawada; Kenji Moriya (ACIT, 2019)

Voltage Surges by Backside ESD Impacts on IC Chip in Flip Chip Packaging. - Takuya Wadatsumi; Kohei Kawai; Rikuu Hasegawa; Takuji Miki; Makoto Nagata; Kikuo Muramatsu; Hiromu Hasegawa; Takuya Sawada; Takahito Fukushima; Hisashi Kondo (IRPS, 2022)

Semi-Supervised Learning Based De-Raining Method for UAV. - Takuya Sawada; Takafumi Katayama; Tian Song; Takashi Shimamoto (ICCE, 2023)

Experimental Exploration of the Backside ESD Impacts on an IC Chip in Flip Chip Packaging. - Takuya Wadatsumi; Kohei Kawai; Rikuu Hasegawa; Kikuo Muramatsu; Hiromu Hasegawa; Takuya Sawada; Takahito Fukushima; Hisashi Kondo; Takuji Miki; Makoto Nagata (IEICE Trans. Electron., 2023)