Kilo-Instruction Processors: Overcoming the Memory Wall. - Adrián Cristal; Oliverio J. Santana; Francisco J. Cazorla; Marco Galluzzi; Tanausú Ramírez; Miquel Pericàs; Mateo Valero (IEEE Micro, 2005)

Kilo-instruction processors, runahead and prefetching. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Mateo Valero (Conf. Computing Frontiers, 2006)

A simple speculative load control mechanism for energy saving. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Mateo Valero (MEDEA@PACT, 2006)

Runahead Threads: Reducing Resource Contention in SMT Processors. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Mateo Valero (PACT, 2007)

Energy saving through a simple load control mechanism. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Mateo Valero (SIGARCH Comput. Archit. News, 2007)

Runahead Threads to improve SMT performance. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Mateo Valero (HPCA, 2008)

Code Semantic-Aware Runahead Threads. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Mateo Valero (ICPP, 2009)

Efficient runahead threads. - Tanausú Ramírez; Alex Pajuelo; Oliverio J. Santana; Onur Mutlu; Mateo Valero (PACT, 2010)

Runahead threads. - Tanausú Ramírez (2010)

Hardware/software-based diagnosis of load-store queues using expandable activity logs. - Javier Carretero; Xavier Vera; Jaume Abella 001; Tanausú Ramírez; Matteo Monchiero; Antonio González 001 (HPCA, 2011)

New reliability mechanisms in memory design for sub-22nm technologies. - Nivard Aymerich; A. Asenov; Andrew R. Brown; Ramon Canal; Binjie Cheng; Joan Figueras; Antonio González 001; Enric Herrero; S. Markov; Miguel Miranda; Peyman Pouyan; Tanausú Ramírez; et al. (IOLTS, 2011)

Capturing vulnerability variations for register files. - Javier Carretero; Enric Herrero; Matteo Monchiero; Tanausú Ramírez; Xavier Vera (DATE, 2013)

Revisiting print-attribute optimization: a direct pattern generation approach. - Peter Morovic; Héctor Gómez; Ján Morovic; Pere Gasparin; Tanausú Ramírez; Xavier Fariña; Sergio Etchebehere (CIC, 2020)