A nondestructive automated defect detection system for silicon carbide wafers. - Toshiro Kubota; Parag Talekar; Xianyun Ma; Tangali S. Sudarshan (Mach. Vis. Appl., 2005)

Effect of crystallographic defects on the reverse performance of 4H-SiC JBS diodes. - A. Grekov; Qingchun Zhang; Fatima Husna; Anant Agarwal; Tangali S. Sudarshan (Microelectron. Reliab., 2008)

Physical phenomena affecting performance and reliability of 4H-SiC bipolar junction transistors. - Peter G. Muzykov; Robert M. Kennedy; Qingchun Zhang; Craig Capell; Al Burk; Anant Agarwal; Tangali S. Sudarshan (Microelectron. Reliab., 2009)