Analysis of an ESD failure mechanism on a SiC MESFET. - Tanguy Phulpin; David Trémouilles; Karine Isoird; Dominique Tournier; Philippe Godignon; Patrick Austin (Microelectron. Reliab., 2014)

Failure analysis of ESD-stressed SiC MESFET. - Tanguy Phulpin; David Trémouilles; Karine Isoird; Dominique Tournier; Philippe Godignon; Patrick Austin (Microelectron. Reliab., 2015)

Broadband Eddy Current Measurement of the Sheet Resistance of GaN Semiconductors. - Ghania Belkacem; Florent Loete; Tanguy Phulpin (Sensors, 2024)