Improving Memory Reliability by Bounding DRAM Faults: DDR5 improved reliability features. - Kjersten Criss; Kuljit Bains; Rajat Agarwal; Tanj Bennett; Terry Grunzke; Jangryul Keith Kim; Hoeju Chung; Munseon Jang (MEMSYS, 2020)

Chip Guard ECC: An Efficient, Low Latency Method. - Tanj Bennett (CoRR, 2023)