eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology. - James A. O'Donnell; Chris Connor; Tanmoy Pramanik; Jeff Hicks; Juan G. Alzate; Fatih Hamzaoglu; Justin Brockman; Oleg Golonzka; Kevin Fischer (IRPS, 2019)

A Reliability Overview of Intel's 10+ Logic Technology. - Rohit Grover; Tony Acosta; C. AnDyke; Emre Armagan; C. Auth; Sunny Chugh; K. Downes; M. Hattendorf; N. Jack; S. Joshi; R. Kasim; Gerald S. Leatherman; et al. (IRPS, 2020)

Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability. - Yao-Feng Chang; Ilya Karpov; Reed Hopkins; David Janosky; Jacob Medeiros; Benjamin Sherrill; Jiahan Zhang; Yifu Huang; Tanmoy Pramanik; Albert B. Chen; Tony Acosta; Abdullah Guler; et al. (IRPS, 2021)

Machine Learning for Statistical Modeling: The Case of Perpendicular Spin-Transfer-Torque Random Access Memory. - Urmimala Roy; Tanmoy Pramanik; Subhendu Roy; Avhishek Chatterjee; Leonard F. Register; Sanjay Kumar Banerjee (ACM Trans. Design Autom. Electr. Syst., 2021)