Cost-effective cleaning and high-quality thin gate oxides. - Marc M. Heyns; Twan Bearda; Ingrid Cornelissen; Stefan De Gendt; Robin Degraeve; Guido Groeseneken; Conny Kenens; D. Martin Knotter; Lee M. Loewenstein; Paul W. Mertens; Sofie Mertens; Marc Meuris; et al. (IBM J. Res. Dev., 1999)

Impact of Transistor Level degradation on product reliability. - Tanya Nigam (CICC, 2009)

CMOS reliability: From discrete device degradation to circuit aging. - Tanya Nigam (VLSI-DAT, 2013)

HTOL SRAM Vmin shift considerations in scaled HKMG technologies. - S. Balasubramanian; Vivek Joshi; Torsten Klick; Randy W. Mann; Joseph Versaggi; Akhilesh Gautam; C. Weintraub; G. Kurz; G. Krause; Andreas Kerber; Biju Parameshwaran; Tanya Nigam (CICC, 2014)

Reliability modeling of HK MG technologies. - Tanya Nigam; Andreas Kerber (CICC, 2014)

Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing. - Yoann Mamy Randriamihaja; William McMahon; S. Balasubramanian; Tanya Nigam; Biju Parameshwaran; Randy W. Mann; Torsten Klick; T. Schaefer; A. Kumar; Y. Song; Vivek Joshi; Rakesh Ranjan; et al. (IRPS, 2015)

Enabling Scaling of Advanced CMOS Technologies: A Reliability Perspective. - Tanya Nigam; Andreas Kerber (ISVLSI, 2015)

Material and device innovation impact on reliability for scaled CMOS technologies. - Tanya Nigam; Andreas Kerber; Tian Shen; Rakesh Ranjan; Linjun Cao (ESSDERC, 2017)

Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. - P. Srinivasan; Rakesh Ranjan; S. Cimino; A. Zainuddin; B. Kannan; L. Pantisano; I. Mahmud; G. Dilliway; Tanya Nigam (IRPS, 2018)

Bias temperature instability in scaled CMOS technologies: A circuit perspective. - Andreas Kerber; Tanya Nigam (Microelectron. Reliab., 2018)

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. - M. Iqbal Mahmud; Amit Gupta; Maria Toledano-Luque; N. Rao Mavilla; Jeffrey B. Johnson; P. Srinivasan 002; A. Zainuddin; S. Rao; Salvatore Cimino; Byoung Min; Tanya Nigam (IRPS, 2019)

A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. - Wafa Arfaoui; Germain Bossu; A. Muehlhoff; D. Lipp; R. Manuwald; T. Chen; Tanya Nigam; Mahesh Siddabathula (IRPS, 2020)

Self-heating characterization and its applications in technology development. - Peter C. Paliwoda; Maria Toledano-Luque; Tanya Nigam; Fernando Guarin; M. Nour; S. Cimino; L. Pantisano; A. Gupta; Oscar Huerta-Gonzalez; M. Hauser; W. Liu; A. Vayshenker; et al. (NATW, 2020)

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. - Maria Toledano-Luque; Peter C. Paliwoda; Mohamed Nour; Thomas Kauerauf; Byoung Min; Germain Bossu; Mahesh Siddabathula; Tanya Nigam (IRPS, 2021)

Optimized LDMOS Offering for Power Management and RF Applications. - Salvatore Cimino; J. Singh; Jeffrey B. Johnson; W. Zheng; Y. Chen; W. Liu; P. Srinivasan 002; O. Gonzales; M. Hauser; Matthew Koskinen; K. Nagahiro; Y. Liu; et al. (IRPS, 2022)

Robust Off-State TDDB Reliability of n-LDMOS. - Wen Liu; Dimitris P. Ioannou; Johnatan Kantarovsky; Byoung Min; Tanya Nigam (IRPS, 2022)