High-constancy offset generator robust to CDAC nonlinearity for SEIR-based ADC BIST. - Yan Duan; Tao Chen 006; Zhiqiang Liu; Xu Zhang; Degang Chen 001 (ISCAS, 2015)

Effect of flicker noise on SEIR for accurate ADC linearity testing. - Yuming Zhuang; Tao Chen 006; Shravan K. Chaganti; Degang Chen 001 (MWSCAS, 2015)

Ultrafast stimulus error removal algorithm for ADC linearity test. - Tao Chen 006; Degang Chen 001 (VTS, 2015)

Low-cost dithering generator for accurate ADC linearity test. - Yan Duan; Tao Chen 006; Degang Chen 001 (ISCAS, 2016)

Accurate linearity testing with impure sinusoidal stimulus robust against flicker noise. - Yuming Zhuang; Tao Chen 006; Shravan K. Chaganti; Degang Chen 001 (VTS, 2016)

An on-chip ADC BIST solution and the BIST enabled calibration scheme. - Xiankun Jin; Tao Chen 006; Mayank Jain; Arun Kumar Barman; David Kramer; Doug Garrity; Randall L. Geiger; Degang Chen 001 (ITC, 2017)

A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. - Yan Duan; Tao Chen 006; Degang Chen 001 (J. Electron. Test., 2017)

Low-cost and accurate DAC linearity test with ultrafast segmented model identification of linearity errors and removal of measurement errors (uSMILE-ROME). - Shravan K. Chaganti; Tao Chen 006; Yuming Zhuang; Degang Chen 001 (I2MTC, 2018)

USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. - Tao Chen 006; Xiankun Jin; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Circuits Syst. I Regul. Pap., 2018)

High-Purity Sine Wave Generation Using Nonlinear DAC With Predistortion Based on Low-Cost Accurate DAC-ADC Co-Testing. - Yuming Zhuang; Benjamin Magstadt; Tao Chen 006; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2018)

Built-in self-test and self-calibration for analog and mixed signal circuits. - Tao Chen 006; Degang Chen 001 (ITC, 2019)

A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. - Chulhyun Park; Tao Chen 006; Kyoohyun Noh; Dadian Zhou; Suraj Prakash; Mohammadhossein Naderi Alizadeh; Aydin I. Karsilayan; Degang Chen 001; Randall L. Geiger; José Silva-Martínez (IEEE Trans. Circuits Syst., 2020)

An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. - Tao Chen 006; Chulhyun Park; Shravan K. Chaganti; José Silva-Martínez; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2020)

A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. - Tao Chen 006; Chulhyun Park; Hao Meng; Dadian Zhou; José Silva-Martínez; Randall L. Geiger; Degang Chen 001 (IEEE Trans. Instrum. Meas., 2020)