Remaining Useful Life Prediction Based on a General Expression of Stochastic Process Models. - Naipeng Li; Yaguo Lei; Liang Guo 001; Tao Yan 004; Jing Lin 001 (IEEE Trans. Ind. Electron., 2017)

Remaining Useful Life Prediction of Machinery Subjected to Two-Phase Degradation Process. - Tao Yan 004; Yaguo Lei; Naipeng Li (ICPHM, 2018)

Machinery health indicator construction based on convolutional neural networks considering trend burr. - Liang Guo 001; Yaguo Lei; Naipeng Li; Tao Yan 004; Ningbo Li (Neurocomputing, 2018)

Deep Convolutional Transfer Learning Network: A New Method for Intelligent Fault Diagnosis of Machines With Unlabeled Data. - Liang Guo 001; Yaguo Lei; Saibo Xing; Tao Yan 004; Naipeng Li (IEEE Trans. Ind. Electron., 2019)

A Wiener-Process-Model-Based Method for Remaining Useful Life Prediction Considering Unit-to-Unit Variability. - Naipeng Li; Yaguo Lei; Tao Yan 004; Ningbo Li; Tianyu Han (IEEE Trans. Ind. Electron., 2019)

Recurrent convolutional neural network: A new framework for remaining useful life prediction of machinery. - Biao Wang 004; Yaguo Lei; Tao Yan 004; Naipeng Li; Liang Guo 001 (Neurocomputing, 2020)

Joint maintenance and spare parts inventory optimization for multi-unit systems considering imperfect maintenance actions. - Tao Yan 004; Yaguo Lei; Biao Wang 004; Tianyu Han; Xiaosheng Si; Naipeng Li (Reliab. Eng. Syst. Saf., 2020)

Remaining useful life prediction based on a multi-sensor data fusion model. - Naipeng Li; Nagi Gebraeel; Yaguo Lei; Xiaolei Fang; Xiao Cai; Tao Yan 004 (Reliab. Eng. Syst. Saf., 2021)

Degradation modeling and remaining useful life prediction for dependent competing failure processes. - Tao Yan 004; Yaguo Lei; Naipeng Li; Biao Wang 004; Wenting Wang (Reliab. Eng. Syst. Saf., 2021)

Deep multisource parallel bilinear-fusion network for remaining useful life prediction of machinery. - Yuan Wang 011; Yaguo Lei; Naipeng Li; Tao Yan 004; Xiaosheng Si (Reliab. Eng. Syst. Saf., 2023)

Machinery Health Prognostics With Multimodel Fusion Degradation Modeling. - Naipeng Li; Yaguo Lei; Xiaofei Liu; Tao Yan 004; Pengcheng Xu 004 (IEEE Trans. Ind. Electron., 2023)