Self-Heating Effect of Device-Circuit with Back-side Power Delivery Network beyond 3nm Node. - Pan Zhao; Jinghan Xu; Taoyu Zhou; Songhan Zhao; Naiqi Liu; Xinpeng Li; Yandong He; Xiaoyan Liu; Gang Du (IRPS, 2024)

Analytical multistage thermal resistance model for NSFET self-heating effects. - Pan Zhao; Taoyu Zhou; Naiqi Liu; Yandong He; Gang Du (Microelectron. J., 2025)