Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. - Tarek Mohamed; Victor M. van Santen; Lilas Alrahis; Ozgur Sinanoglu; Hussam Amrouch (IEEE Trans. Circuits Syst. I Regul. Pap., 2024)

Accelerating Reliability Analysis for Aging and Self-Heating using Machine Learning. - Tarek Mohamed; Hussam Amrouch (ISQED, 2025)