Analysis of Sheet Dimension (W, L) Dependence of NBTI in GAA-SNS FETs. - Nilotpal Choudhury; Tarun Samadder; Ravi Tiwari; Huimei Zhou; Richard G. Southwick; Miaomiao Wang 006; Souvik Mahapatra (IRPS, 2021)

Modeling of HKMG Stack Process Impact on Gate Leakage, SILC and PBTI. - Dimple Kochar; Tarun Samadder; Subhadeep Mukhopadhyay 003; Souvik Mahapatra (IRPS, 2021)

Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs. - Satyam Kumar 003; Tarun Samadder; Karansingh Thakor; Uma Sharma; Souvik Mahapatra (IRPS, 2021)

A Theoretical Framework for Trap Generation and Passivation in NAND Flash Tunnel Oxide During Distributed Cycling and Retention Bake. - Tarun Samadder; Satyam Kumar 003; Karansingh Thakor; Souvik Mahapatra (IRPS, 2021)

Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories. - Karansingh Thakor; Nikhil Rangarajan; Himanshu Diwakar; Rashmi Saikia; Tarun Samadder; Souvik Mahapatra; Shyam Raghunathan; Yingda Dong (IMW, 2024)