Dynamic arbitrary jitter injection method for ≫6.5Gb/s SerDes testing. - Tasuku Fujibe; Masakatsu Suda; Kazuhiro Yamamoto; Yoshihito Nagata; Kazuhiro Fujita; Daisuke Watanabe; Toshiyuki Okayasu (ITC, 2009)

8Gbps CMOS pin electronics hardware macro with simultaneous bi-directional capability. - Shoji Kojima; Yasuyuki Arai; Tasuku Fujibe; Tsuyoshi Ataka; Atsushi Ono; Ken-ichi Sawada; Daisuke Watanabe (ITC, 2012)

Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost. - Masahiro Ishida; Kiyotaka Ichiyama; Tasuku Fujibe; Daisuke Watanabe; Masayuki Kawabata (IEEE Des. Test Comput., 2012)

An Optical/Electrical Test System for 100-Gb/s Optical Interconnection Devices for High Volume Production. - Takeshi Mizushima; Kazuki Shirahata; Tasuku Fujibe; Hidenobu Matsumura; Daisuke Watanabe; Hiroyuki Mineo; Shin Masuda (ATS, 2016)

An Optical Interconnection Test Method Applicable to 100-Gb/s Transceivers Using an ATE Based Hardware. - Kazuki Shirahata; Takeshi Mizushima; Tasuku Fujibe; Hidenobu Matsumura; Tomoyuki Itakura; Masahiro Ishida; Daisuke Watanabe; Shin Masuda (ATS, 2016)

An optical/electrical test system for 100Gb/s optical interconnection devices with high volume testing capability. - Tasuku Fujibe; Kazuki Shirahata; Takeshi Mizushima; Hidenobu Matsumura; Daisuke Watanabe; Hiroyuki Mineo; Shin Masuda (ETS, 2016)