Applying robust multi-response quality engineering for parameter selection using a novel neural-genetic algorithm. - Te-Sheng Li; Chao-Ton Su; Tai-Lin Chiang (Comput. Ind., 2003)

Data Mining using Genetic Programming for Construction of a Semiconductor Manufacturing Yield Rate Prediction System. - Te-Sheng Li; Cheng-Lung Huang; Zong-Yuan Wu (J. Intell. Manuf., 2006)

Applying wavelets transform and support vector machine for copper clad laminate defects classification. - Te-Sheng Li (Comput. Ind. Eng., 2009)

Applying wavelets transform, rough set theory and support vector machine for copper clad laminate defects classification. - Te-Sheng Li (Expert Syst. Appl., 2009)

Defect spatial pattern recognition using a hybrid SOM-SVM approach in semiconductor manufacturing. - Te-Sheng Li; Cheng-Lung Huang (Expert Syst. Appl., 2009)

Parameter optimization of sub-35 nm contact-hole fabrication using particle swarm optimization approach. - Te-Sheng Li; Chih-Ming Hsu (Expert Syst. Appl., 2010)

Modeling and optimization of thermal-flow lithography process using a neural-genetic approach. - Te-Sheng Li; Szu-Hung Chen (J. Intell. Manuf., 2011)