Towards fully automated testing and characterization for photonic compact modeling on 300-mm wafer platform. - Abdelsalam Aboketaf; Crystal Hedges; Vishal Dhurgude; Brendan Harris; Fen Guan; Frank Pavlik; Ted Anderson; Andy Stricker; Yusheng Bian; Michal Rakowski; Arunima Dasgupta; Andrea Paganini (OFC, 2021)