Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA). - Sung-Boem Park; Ted Hong; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009)

QED: Quick Error Detection tests for effective post-silicon validation. - Ted Hong; Yanjing Li; Sung-Boem Park; Diana Mui; David Lin; Ziyad Abdel Kaleq; Nagib Hakim; Helia Naeimi; Donald S. Gardner; Subhasish Mitra (ITC, 2010)

Robust System Design. - Subhasish Mitra; Hyungmin Cho; Ted Hong; Young Moon Kim; Hsiao-Heng Lee; Larkhoon Leem; Yanjing Li; David Lin; Evelyn Mintarno; Diana Mui; Sung-Boem Park; Nishant Patil; et al. (IPSJ Trans. Syst. LSI Des. Methodol., 2011)

Quick detection of difficult bugs for effective post-silicon validation. - David Lin; Ted Hong; Farzan Fallah; Nagib Hakim; Subhasish Mitra (DAC, 2012)

Overcoming post-silicon validation challenges through quick error detection (QED). - David Lin; Ted Hong; Yanjing Li; Farzan Fallah; Donald S. Gardner; Nagib Hakim; Subhasish Mitra (DATE, 2013)

Effective Post-Silicon Validation of System-on-Chips Using Quick Error Detection. - David Lin; Ted Hong; Yanjing Li; Eswaran S; Sharad Kumar; Farzan Fallah; Nagib Hakim; Donald S. Gardner; Subhasish Mitra (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)