Practical, non-invasive optical probing for flip-chip devices. - G. Dajee; Norman Goldblatt; Ted R. Lundquist; Steven Kasapi; Keneth R. Wilsher (ITC, 2001)

Ultra-Thinning of C4 Integrated Circuits for Backside Analysis during First Silicon Debug. - Ted R. Lundquist; E. Delenia; J. Harroun; E. LeRoy; Chun-Cheng Tsao (Microelectron. Reliab., 2001)

Subresolution placement using IR image to CAD database alignment: an algorithm for silicon-side probing. - Madhumita Sengupta; Lokesh Johri; Chun-Cheng Tsao; Mark Thompson; Ted R. Lundquist (Image Processing: Algorithms and Systems, 2002)

Imaging and Material Analysis from Sputter-Induced Light Emission Using Coaxial Ion-Photon Column. - Chun-Cheng Tsao; Bill Thompson 002; Ted R. Lundquist (Microelectron. Reliab., 2002)

Fault Localization using Time Resolved Photon Emission and STIL Waveforms. - Romain Desplats; Felix Beaudoin; Philippe Perdu; Nagamani Nataraj; Ted R. Lundquist; Ketan Shah (ITC, 2003)

Limitations to photon-emission microscopy when applied to "hot" devices. - Hervé Deslandes; Ted R. Lundquist (Microelectron. Reliab., 2003)

Impact of back side circuit edit on active device performance in bulk silicon ICs. - Uwe Kerst; Rudolf Schlangen; A. Kabakow; Erwan Le Roy; Ted R. Lundquist; Siegfried Pauthner (ITC, 2005)

Backside E-Beam Probing on Nano scale devices. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Christian Boit; Rajesh Jain; Tahir Malik; Keneth R. Wilsher; Ted R. Lundquist; Bernd Krüger (ITC, 2007)

Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy. - Rudolf Schlangen; Uwe Kerst; Christian Boit; Tahir Malik; Rajesh Jain; Ted R. Lundquist (Microelectron. Reliab., 2007)

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies. - Christian Boit; Rudolf Schlangen; Uwe Kerst; Ted R. Lundquist (IEEE Des. Test Comput., 2008)

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. - Joy Y. Liao; Tung Ton; Nathan Slattengren; Steven Kasapi; William K. Lo; Howard L. Marks; Yin S. Ng; Ted R. Lundquist (Microelectron. Reliab., 2009)

Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing. - Rudolf Schlangen; Reiner Leihkauf; Uwe Kerst; Ted R. Lundquist; Peter Egger; Christian Boit (Microelectron. Reliab., 2009)

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization. - Rudolf Schlangen; Hervé Deslandes; Ted R. Lundquist; C. Schmidt; Frank Altmann; K. Yu; A. Andreasyan; S. Li (Microelectron. Reliab., 2010)

Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments. - Philipp Scholz; Christian Gallrapp; Uwe Kerst; Ted R. Lundquist; Christian Boit (Microelectron. Reliab., 2010)

Foundry workflow for dynamic-EFA-based yield ramp. - Cathy Kardach; I. Kapilevich; Jeffrey A. Block; Ted R. Lundquist; Steven Kasapi; J. Liao; Yin S. Ng; Bruce Cory (Microelectron. Reliab., 2011)

Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm. - Philipp Scholz; Norbert Herfurth; Michael Sadowski; Ted R. Lundquist; Uwe Kerst; Christian Boit (Microelectron. Reliab., 2014)

Time-integrated photon emission as a function of temperature in 32 nm CMOS. - Andrea Bahgat Shehata; Alan J. Weger; Franco Stellari; Peilin Song; Hervé Deslandes; Ted R. Lundquist; Euan Ramsay (IRPS, 2015)

Two-photon laser-assisted device alteration in CMOS integrated circuits using linearly, circularly and radially polarized light. - Marius Rutkauskas; Carl Farrell; Christophe Dorrer; Kara L. Marshall; Tom Crawford; Ted R. Lundquist; P. Vedagarbha; K. Erington; D. Bodoh; Derryck Telford Reid (Microelectron. Reliab., 2016)