Scanning Thermal Microscopy in Microsystem Reliability Analysis. - R. F. Szeloch; Teodor P. Gotszalk; Pawel Janus (Microelectron. Reliab., 2002)

Data Modeling for Tools and Technologies for the Analysis and Synthesis of NANOstructures (TASNANO) Project. - Mauro Giacomini; Laura Pastorino; Federico Caneva Soumetz; J. A. Mielczarski; E. Mielczarski; Ivo Rangelow; Teodor P. Gotszalk (J. Inf. Technol. Res., 2009)

The regularized blind tip reconstruction algorithm as a scanning probe microscopy tip metrology method - Grzegorz Józwiak; A. Henrykowski; A. Masalska; Teodor P. Gotszalk; I. Ritz; H. Steigmann (CoRR, 2011)

Standard and self-sustained magnetron sputtering deposited Cu films investigated by means of AFM and XRD. - Artur Wiatrowski; W. M. Posadowski; Grzegorz Józwiak; Jaroslaw Serafinczuk; R. F. Szeloch; Teodor P. Gotszalk (Microelectron. Reliab., 2011)

Self-supporting graphene films and their applications. - Stefan Goniszewski; John C. Gallop; Mohammad Adabi; Krzysztof Gajewski; Olena Shaforost; Norbert Klein; Andrzej Sierakowski; Jie Chen 016; Yifang Chen; Teodor P. Gotszalk; Ling Hao (IET Circuits Devices Syst., 2015)

New approach for a multi-cantilever arrays sensor system with advanced MOEMS readout. - Francesco Ivaldi; Tomasz Bieniek; Pawel Janus; Jerzy Zajac; Piotr Grabiec; Wojciech Majstrzyk; D. Kopiec; Teodor P. Gotszalk (ESSDERC, 2016)

Optimal Design of Electromagnetically Actuated MEMS Cantilevers. - Paolo Di Barba; Teodor P. Gotszalk; Wojciech Majstrzyk; Maria Evelina Mognaschi; Karolina Orlowska; Slawomir Wiak; Andrzej Sierakowski (Sensors, 2018)

Sensitivity Improvement to Active Piezoresistive AFM Probes Using Focused Ion Beam Processing. - Piotr Kunicki; Tihomir Angelov; Tzvetan Ivanov; Teodor P. Gotszalk; Ivo Rangelow (Sensors, 2019)

Digital Analysis of Damped Vibrations. - René Laflamme; Piotr Putek; Tomasz Piasecki; Teodor P. Gotszalk (IEEE Instrum. Meas. Mag., 2024)

Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. - Andrzej Sikora; Krzysztof Gajewski; Dominik Badura; Bartosz Pruchnik; Tomasz Piasecki; Kamil Raczkowski; Teodor P. Gotszalk (Sensors, 2024)