IDDQ Sensing Technique for High Speed IDDQ Testing. - Teppei Takeda; Masaki Hashizume; Masahiro Ichimiya; Hiroyuki Yotsuyanagi; Yukiya Miura; Kozo Kinoshita (Asian Test Symposium, 2001)

A BIST Circuit for IDDQ Tests. - Masaki Hashizume; Teppei Takeda; Hiroyuki Yotsuyanagi; Takeomi Tamesada; Yukiya Miura; Kozo Kinoshita (Asian Test Symposium, 2003)