Estimation of Iddq for early chip and technology design decisions. - Terence Hook; Larry Wissel; David Mazgaj (CICC, 2003)

Scalability of planar FDSOI and FinFETs and What's in store for the future beyond that? - Bruce B. Doris; Terence Hook (ESSDERC, 2015)

Super Fast Physics-Based Methodology for Accurate Memory Yield Prediction. - Rajiv V. Joshi; Keunwoo Kim; Rouwaida Kanj; Ajay N. Bhoj; Matthew M. Ziegler; Phil Oldiges; Pranita Kerber; Robert Wong; Terence Hook; Sudesh Saroop; Carl Radens; Chun-Chen Yeh (IEEE Trans. Very Large Scale Integr. Syst., 2015)