The testability features of the 3rd generation ColdFire family of microprocessors. - Alfred L. Crouch; Michael Mateja; Teresa L. McLaurin; John C. Potter; Dat Tran (ITC, 1999)

The testability features of the MCF5407 containing the 4th generation ColdFire(R) microprocessor core. - Teresa L. McLaurin; Frank Frederick (ITC, 2000)

On-the-shelf core pattern methodology for ColdFire(R) microprocessor cores. - Teresa L. McLaurin; John C. Potter (ITC, 2000)

Test Development for a Third-Version ColdFire Microprocessor. - Alfred L. Crouch; Michael Mateja; Teresa L. McLaurin; John C. Potter; Dat Tran (IEEE Des. Test Comput., 2000)

IP and Automation to Support IEEE P1500. - Dwayne Burek; Garen Darbinyan; Rohit Kapur; Maurice Lousberg; Teresa L. McLaurin; Mike Ricchetti (VTS, 2001)

TAPS All Over My Chips. - Teresa L. McLaurin (ITC, 2002)

ETM10 Incorporates Hardware Segment of IEEE P1500. - Teresa L. McLaurin; Souvik Ghosh (IEEE Des. Test Comput., 2002)

On IEEE P1500's Standard for Embedded Core Test. - Erik Jan Marinissen; Rohit Kapur; Maurice Lousberg; Teresa L. McLaurin; Mike Ricchetti; Yervant Zorian (J. Electron. Test., 2002)

The Testability Features of The ARM1026EJ Microprocessor Core. - Teresa L. McLaurin; Frank Frederick; Rich Slobodnik (ITC, 2003)

A methodology for testing one-hot transmission gate multiplexers. - Teresa L. McLaurin; Frank Frederick; Rich Slobodnik (ITC, 2005)

The Challenge of Testing the ARM CORTEX-A8TM Microprocessor Core. - Teresa L. McLaurin (ITC, 2006)

Design for test features of the ARM clock control macro. - Frank Frederick; Teresa L. McLaurin (ITC, 2007)

Enhanced testing of clock faults. - Teresa L. McLaurin; Rich Slobodnik; Kun-Han Tsai; Ana Keim (ITC, 2007)

The ARM Cortex-A8 Microprocessor IEEE Std 1500 Wrapper. - Teresa L. McLaurin; Stylianos Diamantidis; Irakis Diamantidis (IEEE Des. Test Comput., 2009)

The DFT challenges and solutions for the ARM® Cortex™-A15 Microprocessor. - Teresa L. McLaurin; Frank Frederick; Rich Slobodnik (ITC, 2012)

Creating Structural Patterns for At-Speed Testing: A Case Study. - Teresa L. McLaurin (IEEE Des. Test, 2013)

IEEE Std P1838: DfT standard-under-development for 2.5D-, 3D-, and 5.5D-SICs. - Erik Jan Marinissen; Teresa L. McLaurin; Hailong Jiao (ETS, 2016)

Periodic Online LBIST Considerations for a Multicore Processor. - Teresa L. McLaurin (ITC-Asia, 2018)

Improving Power, Performance and Area with Test: A Case Study. - Teresa L. McLaurin; Ignatius P. Lawrence (ITC, 2018)

The Challenges of Implementing an MBIST Interface: A Practical Application. - Teresa McLaurin; Rob Knoth (ITC, 2019)

Applying IEEE Std 1838 to the 3DIC Design Trishul - A Case Study. - Teresa L. McLaurin; Frank Frederick; Heath Perry; Shawn Hung; Saurabh Sinha (ETS, 2021)

Applying IEEE Test Standards to Multidie Designs. - Teresa McLaurin; Adam Cron (IEEE Des. Test, 2022)