Determining factors affecting ESD failure voltage using DOE. - Charles S. Whitman; Terri M. Gilbert; Ann M. Rahn; Jennifer A. Antonell (Microelectron. Reliab., 2006)

Erratum to "Determining factors affecting ESD failure voltage using DOE" [Microelectron. Reliability 46 (2006) 1228-1237]. - Charles S. Whitman; Terri M. Gilbert; Ann M. Rahn; Jennifer A. Antonell (Microelectron. Reliab., 2006)