Test-circuit-based extraction of inter- and intra-chip MOSFET-performance variations for analog-design reliability. - Shizunori Matsumoto; Hans Jürgen Mattausch; S. Ooshiro; Y. Tatsumi; Mitiko Miura-Mattausch; Shigetaka Kumashiro; Terufumi Yamaguchi; Kyoji Yamashita; Noriaki Nakayama (CICC, 2001)