Non-Quasi-Static Carrier Dynamics of MOSFETs under Low-Voltage Operation. - Masataka Miyake; Daisuke Hori; Norio Sadachika; Uwe Feldmann; Mitiko Miura-Mattausch; Hans Jürgen Mattausch; Takahiro Iizuka; Kazuya Matsuzawa; Yasuyuki Sahara; Teruhiko Hoshida; Toshiro Tsukada (IEICE Trans. Electron., 2009)

Modeling of NBTI Stress Induced Hole-Trapping and Interface-State-Generation Mechanisms under a Wide Range of Bias Conditions. - Chenyue Ma; Hans Jürgen Mattausch; Masataka Miyake; Takahiro Iizuka; Kazuya Matsuzawa; Seiichiro Yamaguchi; Teruhiko Hoshida; Akinori Kinoshita; Takahiko Arakawa; Jin He 003; Mitiko Miura-Mattausch (IEICE Trans. Electron., 2013)