Automated Fault Diagnostic EB Tester and Its Application to a 40K-Gate VLSI Circuit. - Norio Kuji; Teruo Tamama (ITC, 1985)

A Fully-Automated Electron Beam Test System for VLSI Circuits. - Norio Kuji; Teruo Tamama; Takao Yano (IEEE Des. Test, 1985)

An Automated F-Beam Tester with CAD Interface, "Finder": A Powerful Tool for Fault Diagnosis of ASICs. - Norio Kuji; Teruo Tamama (ITC, 1986)

Integrating an Electron-Beam System into VLSI Fault Diagnosis. - Teruo Tamama; Norio Kuji (IEEE Des. Test, 1986)

FINDER: A CAD System-Based Electron Beam Tester for Fault Diagnosis of VLSI Circuits. - Norio Kuji; Teruo Tamama; M. Nagatani (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1986)

Key Technologies for 500 MHz VLSI Test System "ULTIMATE". - Teruo Tamama; Naoaki Narumi; Tai-ichi Otsuji; Masao Suzuki; Tsuneta Sudo (ITC, 1988)