Test generation for multiple faults based on parallel vector pair analysis. - Seiji Kajihara; Tetsuji Sumioka; Kozo Kinoshita (ICCAD, 1993)

Acceleration Techniques of Multiple Fault Test Generation Using Vector Pair Analysis. - Seiji Kajihara; Rikiya Nishigaya; Tetsuji Sumioka; Kozo Kinoshita (IEICE Trans. Inf. Syst., 1995)