A new methodology for providing insight into manufacturing using KPIs based on SMKL (Smart Manufacturing Kaizen Level), utilizing industry standards (OPC UA, FDT, PLCopen and AutomationML). - Mitsushiro Fujishima; Shinobu Ueda; Hisato Yoneda; Takashi Yoshizawa; Akio Ito; Tetsuo Takeuchi; Shinichiro Chino; Kenji Kitayama; Toshio Ono; Takashi Matsukuma; Hiroshi Yoshida; Makoto Okuda; et al. (SICE, 2020)

Leveraging IT technology into FDT3 specification realizes FITS™ architecture. - Thomas Hadlich; Manfred Gundel; Jason Chan Sin Wai; Glenn Schulz; Tetsuo Takeuchi; Akio Ito (SICE, 2020)

Device Data Utilization Use Case Analysis for FDT Technology in Industrial Control System. - Akio Ito; Jason Chan Sin Wai; Tetsuo Takeuchi; Yoshiharu Amano (SICE, 2021)

Device Data Application Phase1 on Trusted Data Platform GAIA-X for Decarbonization in Industry. - Akio Ito; Akira Sakaino; Shinichiro Chino; Takashi Horikoshi; Mitsushiro Fujishima; Shuichi Ogawa; Tetsuo Takeuchi; Yoshiharu Amano (SICE, 2022)