A 1-Mbit BiCMOS DRAM using temperature-compensation circuit techniques. - Goro Kitsukawa; Kiyoo Itoh 001; Ryoichi Hori; Yoshiki Kawajiri; Takao Watanabe; Takayuki Kawahara; Tetsuro Matsumoto; Yutaka Kobayashi (IEEE J. Solid State Circuits, 1989)

Comparison of CMOS and BiCMOS 1-Mbit DRAM performance. - Takao Watanabe; Goro Kitsukawa; Yoshiki Kawajiri; Kiyoo Itoh 001; Ryoichi Hori; Yoshiaki Ouchi; Takayuki Kawahara; Tetsuro Matsumoto (IEEE J. Solid State Circuits, 1989)

Substrate current reduction techniques for BiCMOS DRAM. - Takayuki Kawahara; Goro Kitsukawa; Hisayuki Higuchi; Yoshiki Kawajiri; Takao Watanabe; Kiyoo Itoh 001; Ryoichi Hori; Yutaka Kobayashi; Tetsuro Matsumoto (IEEE J. Solid State Circuits, 1989)

A tunable CMOS-DRAM voltage limiter with stabilized feedback amplifier. - Masashi Horiguchi; Masakazu Aoki; Jun Etoh; Hitoshi Tanaka; Shin'ichi Ikenaga; Kiyoo Itoh 001; Kazuhiko Kajigaya; Hiroaki Kotani; Kazuyoshi Ohshima; Tetsuro Matsumoto (IEEE J. Solid State Circuits, 1990)

A 23-ns 1-Mb BiCMOS DRAM. - Goro Kitsukawa; Kazumasa Yanagisawa; Yutaka Kobayashi; Yoshitaka Kinoshita; Tatsuyuki Ohta; Tetsu Udagawa; Hitoshi Miwa; Hiroyuki Miyazawa; Yoshiki Kawajiri; Yoshiaki Ouchi; Hiromi Tsukada; Tetsuro Matsumoto; et al. (IEEE J. Solid State Circuits, 1990)

A flexible redundancy technique for high-density DRAMs. - Masashi Horiguchi; Jun Etoh; Masakazu Aoki; Kiyoo Itoh 001; Tetsuro Matsumoto (IEEE J. Solid State Circuits, 1991)

Dual-regulator dual-decoding-trimmer DRAM voltage limiter for burn-in test. - Masashi Horiguchi; Masakazu Aoki; Jun Etoh; Gyoo Itoh; Kazuhiko Kajigaya; Atsushi Nozoe; Tetsuro Matsumoto (IEEE J. Solid State Circuits, 1991)

Measurement System for Switching Current Distribution in Intrinsic Josephson Junctions. - Hiromi Kashiwaya; Tetsuro Matsumoto; Hajime Shibata; Kiyoe Tani; Satoshi Kashiwaya (IEICE Trans. Electron., 2007)

Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons. - Kazusa Takami; Yuibi Gomi; Shin-ichiro Abe; Wang Liao; Seiya Manabe; Tetsuro Matsumoto; Masanori Hashimoto (IRPS, 2023)