Fine-Grained In-Circuit Continuous-Time Probing Technique of Dynamic Supply Variations in SoCs. - Mitsuya Fukazawa; Tetsuro Matsuno; Toshifumi Uemura; Rei Akiyama; Tetsuya Kagemoto; Hiroshi Makino; Hidehiro Takata; Makoto Nagata (ISSCC, 2007)