Reverse short-channel effect due to lateral diffusion of point-defect induced by source/drain ion implantation. - Tatsuya Kunikiyo; Katsuyoshi Mitsui; Masato Fujinaga; Tetsuya Uchida; Norihiko Kotani (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994)

3-D numerical modeling of thermal flow for insulating thin film using surface diffusion. - Masato Fujinaga; I. Tottori; Tatsuya Kunikiyo; Tetsuya Uchida; Norihiko Kotani; Yasumasa Tsukamoto (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995)

A 500-MHz 4-Mb CMOS pipeline-burst cache SRAM with point-to-point noise reduction coding I/O. - Kazuyuki Nakamura; Koichi Takeda 001; Hideo Toyoshima; Kenji Noda; Hiroaki Ohkubo; Tetsuya Uchida; Toshiyuki Shimizu; Toshiro Itani; Ken Tokashiki; Koji Kishimoto (IEEE J. Solid State Circuits, 1997)

A 250-Mb/s/pin, 1-Gb double-data-rate SDRAM with a bidirectional delay and an interbank shared redundancy scheme. - Yasuhiro Takai; Mamoru Fujita; Kyoichi Nagata; Satoshi Isa; Shigeyuki Nakazawa; Atsunori Hirobe; Hiroaki Ohkubo; Masato Sakao; Shinichi Horiba; Tadashi Fukase; Yoshihiro Takaishi; Makoto Matsuo; et al. (IEEE J. Solid State Circuits, 2000)

The simulation for accuracy validation of OCT based non-harmonic analysis. - Tetsuya Uchida; Xu Cao; Shigeki Hirobayashi; Tadanobu Misawa; Toshio Yoshizawa; Changho Chong; Atsushi Morosawa; Takuya Suzuki (BMEI, 2011)