Component Value Calculations and Characterizations for Measurements in the IEEE 1149.4 Environment. - Teuvo Saikkonen; Markku Moilanen (J. Electron. Test., 2007)

Enabling Remote Testing: Embedded Test Controller and Mixed-signal Test Architecture. - Jari Hannu; Teuvo Saikkonen; Juha Häkkinen; Juha Karttunen; Markku Moilanen (J. Electron. Test., 2010)