Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments. - Th. Calin; F. L. Vargas; Michael Nicolaidis (ITC, 1995)

Fault Detection for Linear Analog Circuits Using Current Injection. - Jaime Velasco-Medina; Th. Calin; Michael Nicolaidis (DATE, 1998)

Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS. - Th. Calin; Lorena Anghel; Michael Nicolaidis (VTS, 1999)

ISIS: A Fail-Safe Interface Realized in Smart Power Technology. - Michael Nicolaidis; N. Zaidan; Th. Calin; D. Bied-Charreton (IOLTW, 2000)