Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. - R. Lavieville; Theano A. Karatsori; Christoforos G. Theodorou; Sylvain Barraud; C. A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2016)

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. - Ioannis Messaris; Theano A. Karatsori; Nikolaos Fasarakis; Christoforos G. Theodorou; Spiros Nikolaidis 001; Gérard Ghibaudo; C. A. Dimitriadis (Microelectron. Reliab., 2016)

Static and Low Frequency Noise Characterization of InGaAs MOSFETs and FinFETs on Insulator. - Theano A. Karatsori; K. Bennamane; Christoforos G. Theodorou; L. Czornomaz; Jean Fompeyrine; Cezar B. Zota; Clarissa Convertino; Gérard Ghibaudo (ESSDERC, 2018)

Analysis of Gate Current Wafer Level Variability in Advanced FD-SOI MOSFETs. - Krishna Pradeep; Theano A. Karatsori; Thierry Poiroux; Andre Juge; Patrick Scheer; Gilles Gouget; Emmanuel Josse; Gérard Ghibaudo (ESSDERC, 2018)