The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2002)

A simple design methodology for increased ESD robustness of CMOS core cells. - Albert Jan Huitsing; Theo Smedes; H.-U. Schröder (ESSCIRC, 2003)

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. - M. S. B. Sowariraj; Theo Smedes; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2003)

Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage current. - F. Barbier; Fabrice Blanc; A. Le Grontec; R. Colclaser; Theo Smedes; M. Johnson; Serge Bardy; Philippe Descamps (Microelectron. Reliab., 2004)

A case study of ESD failures at random levels: analysis, explanation and solution. - T. Wu; Theo Smedes; J. P. Lokker; S.-N. Mei; J. W. Slotboom (Microelectron. Reliab., 2004)

A 3-D Circuit Model to evaluate CDM performance of ICs. - M. S. B. Sowariraj; Theo Smedes; Peter C. de Jong; Cora Salm; Ton J. Mouthaan; Fred G. Kuper (Microelectron. Reliab., 2005)

Selecting an appropriate ESD protection for discrete RF power LDMOSTs. - Theo Smedes; J. de Boet; T. Rödle (Microelectron. Reliab., 2007)

An ESD test reduction method for complex devices. - Dejan M. Maksimovic; Fabrice Blanc; Guido Notermans; Theo Smedes; Thomas Keller 004 (Microelectron. Reliab., 2009)

ESD robust high-voltage active clamps. - Guido Notermans; Olivier Quittard; Anco Heringa; Zeljko Mrcarica; Fabrice Blanc; Hans van Zwol; Theo Smedes; Thomas Keller 004; Peter C. de Jong (Microelectron. Reliab., 2009)

ESD testing of devices, ICs and systems. - Theo Smedes (Microelectron. Reliab., 2009)

ESD protection for thin gate oxides in 65 nm. - Guido Notermans; Theo Smedes; Zeljko Mrcarica; Peter C. de Jong; Ralph Stephan; Hans van Zwol; Dejan M. Maksimovic (Microelectron. Reliab., 2010)

On-chip system level protection of FM antenna pin with improved linearity. - Guido Notermans; Dejan M. Maksimovic; Gerd Vermont; Michiel van Maasakkers; Fredrik Pusa; Theo Smedes (Microelectron. Reliab., 2011)

Pitfalls for CDM calibration procedures. - Theo Smedes; M. Polewski; A. van IJzerloo; Jean Luc Lefebvre; M. Dekker (Microelectron. Reliab., 2013)

An integral injector-victim current transfer model for latchup design rule optimization. - Guido Quax; Theo Smedes (IRPS, 2018)

Analysis of VF-TLP ESD Measurements Using Machine Learning. - Seyed Hossein Hosseini; Mehrdad Nourani; Theo Smedes; Charvaka Duvvury (ISQED, 2025)