Reliability-aware design method for CMOS circuits. - Theodor Hillebrand; Nico Hellwege; Steffen Paul; Dagmar Peters-Drolshagen (ERMAVSS@DATE, 2016)

Online monitoring of NBTI and HCD in beta-multiplier circuits. - Theodor Hillebrand; Maike Taddiken; Konstantin Tscherkaschin; Steffen Paul; Dagmar Peters-Drolshagen (IOLTS, 2016)

Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process. - Konstantin Tscherkaschin; Theodor Hillebrand; Maike Taddiken; Steffen Paul; Dagmar Peters-Drolshagen (IOLTS, 2016)

Stochastic LUT-based reliability-aware design method for operation point dependent CMOS circuits. - Theodor Hillebrand; Nico Hellwege; Maike Taddiken; Konstantin Tscherkaschin; Steffen Paul; Dagmar Peters-Drolshagen (MIXDES, 2016)

Parameter identification for behavioral modeling of analog components including degradation. - Maike Taddiken; Theodor Hillebrand; Konstantin Tscherkaschin; Steffen Paul; Dagmar Peters-Drolshagen (MIXDES, 2016)

Degradation and temperature analysis of voltage-controlled ring oscillators for robust and reliable oscillator designs in a 65nm bulk CMOS process. - Konstantin Tscherkaschin; Theodor Hillebrand; Maike Taddiken; Steffen Paul; Dagmar Peters-Drolshagen (MIXDES, 2016)

Design and verification of analog CMOS circuits using the gm/ID-method with age-dependent degradation effects. - Theodor Hillebrand; Timur Schafer; Nico Hellwege; Marco Erstling; Dagmar Peters-Drolshagen; Steffen Paul (PATMOS, 2016)

Behavioral modeling of a sensor interface circuit including various non-idealities. - Sascha Heinssen; Maike Taddiken; Theodor Hillebrand; Steffen Paul; Dagmar Peters-Drolshagen (SMACD, 2017)

Variation- and degradation-aware stochastic behavioral modeling of analog circuit components. - Maike Taddiken; Theodor Hillebrand; Steffen Paul; Dagmar Peters-Drolshagen (SMACD, 2017)

Design and Verification of Analog CMOS Circuits Using the g m/I D-Method with Age-Dependent Degradation Effects. - Timur Schafer; Theodor Hillebrand; Nico Hellwege; Marco Erstling; Dagmar Peters-Drolshagen; Steffen Paul (J. Low Power Electron., 2017)

Reliability-Aware Multi-Vth Domain Digital Design Assessment. - Theodor Hillebrand; Ludwig Karsthof; Steffen Paul; Dagmar Peters-Drolshagen (DDECS, 2018)

A New Approach to Threshold Voltage Measurements of Transistors. - Theodor Hillebrand; Steffen Paul; Dagmar Peters-Drolshagen (IOLTS, 2018)

Topology-Driven Reliability Assessment of Integrated Circuits. - Theodor Hillebrand; Steffen Paul; Dagmar Peters-Drolshagen (MIXDES, 2018)

Yield Approximation of Analog Integrated Circuits Under Time-Dependent Variability. - Theodor Hillebrand; Maike Taddiken; Steffen Paul; Dagmar Peters-Drolshagen (SMACD, 2018)

LUT-Based Stochastic Modeling for Non-Normal Performance Distributions. - Maike Taddiken; Theodor Hillebrand; Steffen Paul; Dagmar Peters-Drolshagen (SMACD, 2018)

On-line monitoring and error correction in sensor interface circuits using digital calibration techniques. - Sascha Heinssen; Theodor Hillebrand; Maike Taddiken; Steffen Paul; Dagmar Peters-Drolshagen (VTS, 2018)

Design for reliability of generic sensor interface circuits. - Sascha Heinssen; Theodor Hillebrand; Maike Taddiken; Konstantin Tscherkaschin; Steffen Paul; Dagmar Peters-Drolshagen (Microelectron. Reliab., 2018)